Scanning probe microscopy - PDFSEARCH.IO - Document Search Engine

Scanning probe microscopy
Results: 577

#	Item
141	10 Instrumentation and Technique 10-1 Magnetic Domain Imaging by Photoelectron Emission Microscopy micro-magnetic structures is important for the implementation of high-density data storage techniques, such as patterned Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:29:25 Spectroscopy Microscopes Photoemission electron microscopy Scanning probe microscopy X-ray magnetic circular dichroism Magnetism Ferromagnetism Magnetic force microscope Electron Physics Condensed matter physics Electromagnetism
142	workshop WITec GmbH . Lise-Meitner-StrUlm Germany . . www.witec.de fon: + . fax: +Introduction to Confocal Raman and Scanning Probe Microscopy Add to Reading List Source URL: www.witec.de Language: English - Date: 2014-08-08 10:21:28 Science Microscopy Near-field scanning optical microscope Ansan Raman microscope Scanning probe microscopy Confocal Chemistry Microbiology Microscopes Raman spectroscopy
143	Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved. Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Magnetic force microscope Park Systems Microscopy Scanning electron microscope Nanometrology Image scanner Atomic force microscopy Vibrational analysis with scanning probe microscopy Science Scientific method Scanning probe microscopy
144	TERS 3D Raman Imaging Nearfield-Raman Add to Reading List Source URL: www.witec.de Language: English - Date: 2014-10-14 09:26:50 Microscopy Scanning probe microscopy Raman spectroscopy Intermolecular forces Spectroscopy Near-field scanning optical microscope Raman microscope Atomic force microscopy Confocal microscopy Chemistry Science Scientific method
145	“NOTICE: this is the author’s version of a work that was accepted for publication in Micron. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other Add to Reading List Source URL: ses.library.usyd.edu.au Language: English - Date: 2014-06-24 12:52:41 Fluid mechanics Scanning probe microscopy Piping Intermolecular forces Atomic force microscopy Drag Reynolds number Friction Viscosity Aerodynamics Physics Fluid dynamics
146	Scanning Thermal Microscopy (SThM) High Spatial and Thermal Resolution Microscopy by the XE-series Innovations High Resolution Scanning Thermal Microscopy (SThM) with the XE-Series AFM There has been growing interest in Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2009-12-22 18:00:00 Scanning probe microscopy Heat transfer Microscopy Scanning thermal microscopy Thermal conductivity measurement Thermal conductivity Resistance thermometer R-value Measuring instrument Science Chemistry Scientific method
147	F-d Spectroscopy Force Measurement of Tip-Sample Interaction Force vs. Distance Spectroscopy Force vs. distance (F vs. d) curves are used to measure the vertical force that the tip applies to the surface while a contact- Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2009-12-27 18:00:00 Chemistry Intermolecular forces Nanotechnology Cantilever Structural system Deflection Contact mechanics Atomic force microscopy Force spectroscopy Scanning probe microscopy Science Scientific method
148	Mode Note Scanning Tunneling Microscopy (STM) Probing the Local Electronic Structure of a Sample’s Surface Scanning Tunneling Microscopy (STM) is one of the application modes for XE series SPM. STM is the ancestor of Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2009-12-27 18:00:00 Chemistry Scanning tunneling microscope Microscope Nanotechnology Scanning tunneling spectroscopy Conductive atomic force microscopy Scanning probe microscopy Scientific method Science
149	Mode Note Scanning Capacitance Microscopy (SCM) High Resolution and High Sensitivity Imaging of Charge Distribution Characterization of Semiconductor Device with Non-Destructive Technique and High Spatial Resolution Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2009-12-27 18:00:00 Physics Technology MOSFET Capacitance Depletion region Diode P–n junction Capacitor Field-effect transistor Scanning probe microscopy Scanning capacitance microscopy Electromagnetism
150	Ultimate Resolution of AFM in Air The Preservation of Tip and Sample is a Critical Factor The Ultimate Resolution of Atomic Force Microscope “What is the ultimate resolution of AFM in air?” As significant as the answ Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2009-12-22 18:00:00 Chemistry Atomic force microscopy AFM probe Magnetic force microscope Vibrational analysis with scanning probe microscopy Scanning probe microscopy Science Scientific method

UPDATE